Re: RFC: Some more store.exp failures - tweak the test

[Andrew Cagney <ac131313 at redhat dot com>]

> This patch fixes the store.exp failures for ARM.  Two changes:
>   - Change char to signed char, because some patterns match -1.  If anyone
>     prefers changing the patterns to match 255 would work too.

Yes, but use something like `typedef signed char charest' so that the 
function's pattern doesn't need tweaking.

>   - Change "return l" to "return l + r".  "up; print r" doesn't work if
>     "r" is not live across the function call; even without optimization
>     GCC will re-use the register.  Then we lose.

As an aside, isn't that a GCC bug?  If no optimization, shouldn't "r" 
have a single permenant location?  The user's going to expect it to 
work, no matter how dumb their code.

> I believe these changes don't impact the point of the test.  If nobody
> disagrees with me, I'd like to commit this.

Andrew